Abstract
Presented is a report on the first low temperature near-field scanning optical microscopy study of a single, nanometer dimension, cleaved edge overgrown quantum wire fabricated by this technique. A direct experimental comparison between a two-dimensional system and a single genuinely one-dimensional quantum wire system, inaccessible to conventional far-field optical spectroscopy, is enabled by enhanced spatial resolution.
| Original language | English (US) |
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| Pages | 26-27 |
| Number of pages | 2 |
| State | Published - 1996 |
| Externally published | Yes |
| Event | Proceedings of the 1996 6th Quantum Electronics and Laser Science Conference, QELS - Anaheim, CA, USA Duration: Jun 2 1996 → Jun 7 1996 |
Conference
| Conference | Proceedings of the 1996 6th Quantum Electronics and Laser Science Conference, QELS |
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| City | Anaheim, CA, USA |
| Period | 6/2/96 → 6/7/96 |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy