Nanostructure characterization of (SmS)1.19TaS2 by means of STM/STS

S. Winiarz, T. Klimczuk, R. J. Cava, R. Czajka

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Layered transition-metal dichalcogenide (LTMD) materials have been studied extensively. These materials can be easily intercalated with different elements due to their layered structure. This report shows the results of scanning tunneling microscopy and spectroscopy (STM/S) investigations of (SmS)1.19TaS2 misfit-layer compound. This compound is composed of two trigonal triple layers of S-Ta-S separated from one another by the SmS double layer. The structure of SmS layers exhibits square symmetry contrary to the trigonal TaS2 host structure. The observed lattice symmetry suggests that the SmS layer was exposed due to cleavage process made before measurements. The I-V characteristics measured above the sample surface showed metallic-like behavior of this material.

Original languageEnglish (US)
Pages (from-to)7-9
Number of pages3
JournalJournal of Crystal Growth
Issue number1
StatePublished - Dec 15 2006

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry


  • A1. Crystal structure
  • A1. Surface structure
  • B1. Rare-earth compounds


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