Lamination of metal-coated elastomeric stamps against thin films of electroactive organics provides non-invasive, high resolution electrical contacts for investigations of charge transport in these materials. This approach uses the features of relief on the stamps to define, with nanometer resolution, the geometry and separation of electrodes that are formed by uniform evaporation of a thin metal film onto the stamp. Soft, room temperature contact of an element of this type with an organic semiconductor film on a gate dielectric and a gate yields a high performance top contact transistor with source/drain electrodes supported by the stamp. We review here our use of this approach to study the electrical properties of the organic semiconductor pentacene in thin film transistors structures. We also introduce a method for using the same techniques and structures to probe transport through organic monolayers.