Nanoscale measurements of electronic properties in organic thin film transistors

Oren Tal, Yossi Rosenwaks, Yohai Roichman, Nir Tessler, Calvin K. Chan, Antoine Kahn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Kelvin probe force microscopy was used for extraction of the threshold and the pinch off voltages in organic thin film transistors. The first was determined by direct detection of the charge accumulation onset and the latter by a direct observation of the pinch off region formation. In addition, an effective threshold voltage shift can be extracted from the pinch-off voltage as a function of charge concentration. The dependence of the effective threshold voltage on the gate voltage must be considered when calculating charge carrier concentrations in organic thin film transistors.

Original languageEnglish (US)
Title of host publicationOrganic Thin-Film Electronics
Pages126-131
Number of pages6
Volume871
StatePublished - Dec 1 2005
Event2005 MRS Spring Meeting - San Francisco, CA, United States
Duration: Mar 28 2005Apr 1 2005

Other

Other2005 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period3/28/054/1/05

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Tal, O., Rosenwaks, Y., Roichman, Y., Tessler, N., Chan, C. K., & Kahn, A. (2005). Nanoscale measurements of electronic properties in organic thin film transistors. In Organic Thin-Film Electronics (Vol. 871, pp. 126-131)