Nanoscale and submicron fatigue crack growth in nickel microbeams

Y. Yang, N. Yao, B. Imasogie, W. O. Soboyejo

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

This paper presents a novel edge-notched microbeam technique for the study of short fatigue crack growth. The technique is used to study submicron and nanoscale fatigue in LIGA Ni thin films with columnar microstructures. The edge-notched microbeams were fabricated within LIGA Ni thin films, using focused ion beam (FIB) techniques. The microbeams were then cyclically deformed to failure at a stress ratio of 0.1. Different slip-band structures were observed below the nanoscale notches. Cyclic deformation resulted in the formation of primary slip bands below the notch. Subsequent crack growth then occurred by the unzipping of fatigue cracks along intersecting slip bands. The effects of the primary slip bands were idealized using dislocation-based models. These were used to estimate the intrinsic fatigue threshold and the fatigue endurance limit. The estimates from the model are shown to be consistent with experimental data from prior stress-life experiments and current/prior fatigue threshold estimates.

Original languageEnglish (US)
Pages (from-to)4305-4315
Number of pages11
JournalActa Materialia
Volume55
Issue number13
DOIs
StatePublished - Aug 2007

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

Keywords

  • Focused ion beam (FIB)
  • Short fatigue crack growth
  • Slip bands
  • Thin films

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