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Multiple Stuck-Open Fault Detection in CMOS Logic Circuits
Niraj K. Jha
Electrical and Computer Engineering
Princeton Language and Intelligence (PLI)
Research output
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Contribution to journal
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Article
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peer-review
22
Scopus citations
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Computer Science
Fault Coverage
100%
Fault Detection
100%
Keyphrases
Two-pattern Tests
33%
Pattern Test
22%
Fan-out
11%