Abstract
Few-layer graphene films are grown using a Molecular Beam Deposition (MBD) technique in ultra-high vacuum by evaporation of atomic carbon and subsequent annealing of the samples at 800-900 °C. The graded thickness layers are grown on strip-shaped oxidized silicon substrates which are covered with 300 nm thick nickel films deposited by e-beam evaporation. The thickness of the deposited carbon layers changes continuously from ∼70 Å to less than 4 Å. The relatively narrow optical phonon bands in Raman spectroscopy reveal that good quality multilayer graphene films form on the Ni surface.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 809-811 |
| Number of pages | 3 |
| Journal | Solid State Communications |
| Volume | 150 |
| Issue number | 17-18 |
| DOIs | |
| State | Published - May 2010 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Chemistry
- Condensed Matter Physics
- Materials Chemistry
Keywords
- A. Graphene
- B. Crystal growth
- E. Inelastic light scattering