Multi-order Scaling of High-throughput Transmission Electron Microscopy

Christopher S. Own; Theodore DeRego; Lawrence S. Own; Gerward Weppelman; Adrian A. Wanner; Sebastian Ströh; Eric Hammerschmith; Ashwin Vishwanathan; H. Sebastian Seung

doi:10.1017/s1431927619005932

Multi-order Scaling of High-throughput Transmission Electron Microscopy

Christopher S. Own
, Theodore DeRego
, Lawrence S. Own
, Gerward Weppelman
, Adrian A. Wanner
, Sebastian Ströh
, Eric Hammerschmith
, Ashwin Vishwanathan
, H. Sebastian Seung

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1040-1041
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	25
DOIs	https://doi.org/10.1017/s1431927619005932
State	Published - Aug 1 2019

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/s1431927619005932

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title = "Multi-order Scaling of High-throughput Transmission Electron Microscopy",

author = "Own, \{Christopher S.\} and Theodore DeRego and Own, \{Lawrence S.\} and Gerward Weppelman and Wanner, \{Adrian A.\} and Sebastian Str{\"o}h and Eric Hammerschmith and Ashwin Vishwanathan and Seung, \{H. Sebastian\}",

year = "2019",

month = aug,

day = "1",

doi = "10.1017/s1431927619005932",

language = "English (US)",

volume = "25",

pages = "1040--1041",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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TY - JOUR

T1 - Multi-order Scaling of High-throughput Transmission Electron Microscopy

AU - Own, Christopher S.

AU - DeRego, Theodore

AU - Own, Lawrence S.

AU - Weppelman, Gerward

AU - Wanner, Adrian A.

AU - Ströh, Sebastian

AU - Hammerschmith, Eric

AU - Vishwanathan, Ashwin

AU - Seung, H. Sebastian

PY - 2019/8/1

Y1 - 2019/8/1

UR - https://www.scopus.com/pages/publications/85114847896

UR - https://www.scopus.com/pages/publications/85114847896#tab=citedBy

U2 - 10.1017/s1431927619005932

DO - 10.1017/s1431927619005932

M3 - Article

C2 - 34421339

AN - SCOPUS:85114847896

SN - 1431-9276

VL - 25

SP - 1040

EP - 1041

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Multi-order Scaling of High-throughput Transmission Electron Microscopy

All Science Journal Classification (ASJC) codes

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