Five polystyrene-poly(dimethylsiloxane) (PS/PDMS) diblocks were synthesized by sequential anionic polymerization, and their morphologies characterized by small-angle X-ray scattering (SAXS) and transmission electron microscopy (TEM). All materials are microphase-separated in toluene-cast films, and estimates of the interaction parameter χ indicate that these materials are all strongly segregated. The experimentally determined phase diagram is strongly skewed towards low styrene volume fractions, even more than the styrene-isoprene (SI) diblock phase diagram, even though little conformational asymmetry should exist in the PS/PDMS system. The PS/PDMS diblocks form substantially larger microdomain structures than the analogous SI diblocks, reflecting the stronger segregation strength.
All Science Journal Classification (ASJC) codes
- Organic Chemistry
- Polymers and Plastics
- Materials Chemistry
- diblock copolymer