Abstract
The molecular dynamics simulation of ion bombardment on hydrogen terminated Si (001)2×1 surface was discussed. Normal incidence ion bombardment effects on dangling bond generation, adatom diffusion and nucleation were also studied. The analysis showed that the enhanced diffusion of Si adatoms due to ion bombardment was minor in comparison with thermal diffusion.
Original language | English (US) |
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Pages (from-to) | 484-490 |
Number of pages | 7 |
Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 21 |
Issue number | 2 |
DOIs | |
State | Published - Mar 2003 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films