Abstract
High quality GaN/AlGaN multiple quantum wells were grown by molecular beam epitaxy on (0001) sapphire substrates. The GaN wells range in thickness between 10 and 30Å while the AlGaN composition of the barriers was varied between 45 and 85%. Structural studies by cross-sectional transmission electron microscopy show that the GaN/AlGaN interfaces are abrupt with thickness uniformity on the order of one (Al)GaN monolayer. Intersubband absorption was observed between 1.5 to 4.2 μm depending on the well thickness and barrier height. This is the first observation of intersubband absorption at a wavelength as short as 1.5 μm for the III-nitrides material system.
Original language | English (US) |
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Pages | 245-249 |
Number of pages | 5 |
State | Published - 2000 |
Externally published | Yes |
Event | 27th International Symposium on Compound Semiconductors - Monterey, CA, United States Duration: Oct 2 2000 → Oct 5 2000 |
Other
Other | 27th International Symposium on Compound Semiconductors |
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Country/Territory | United States |
City | Monterey, CA |
Period | 10/2/00 → 10/5/00 |
All Science Journal Classification (ASJC) codes
- General Engineering