Mode imaging and loss evaluation of semiconductor waveguides

Toshimitsu Mochizuki, Changsu Kim, Masahiro Yoshita, Takahiro Nakamura, Hidefumi Akiyama, Loren N. Pfeiffer, Ken W. West

Research output: Contribution to journalArticlepeer-review

Abstract

An imaging and loss evaluation method for semiconductor waveguides coupled with non-doped quantum wells is presented. Using the internal emission of the wells as a probe light source, the numbers and widths of the modes of waveguides with various ridge sizes were evaluated by CCD imaging, and the obtained values were consistent with effective index method calculation. Waveguide internal losses were obtained from analyses of the Fabry-Pérot fringes of waveguide emission spectra. We quantified the quality of 29 single-mode waveguide samples as an internal loss and variation of 10.2 ± 0.6 cm -1.

Original languageEnglish (US)
Article number053109
JournalReview of Scientific Instruments
Volume85
Issue number5
DOIs
StatePublished - May 2014
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation

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