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Modal analysis of semiconductor cylinder fibers
Darren Rand
, Bryan C. Ellis
,
Paul R. Prucnal
Electrical and Computer Engineering
Princeton Materials Institute
Research output
:
Contribution to journal
›
Article
›
peer-review
2
Scopus citations
Overview
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Material Science
Refractive Index
100%
Modal Analysis
100%
Carrier Concentration
50%
Waveguide
50%
Thin Films
50%
Semiconducting Film
50%
Keyphrases
Semiconductor Model
20%
Annular Mode
20%
Thin Film Effect
20%
Modal Properties
20%
Fiber Layer
20%
Modal Effective Index
20%
Complex Refractive Index
20%
Carrier-induced
20%