Millimeter-wave antireflection coating for cryogenic silicon lenses

Judy Lau; Joseph Fowler; Tobias Marriage; Lyman Page; Jon Leong; Edward Wishnow; Ross Henry; Ed Wollack; Mark Halpern; Danica Marsden; Gaelen Marsden

doi:10.1364/AO.45.003746

Millimeter-wave antireflection coating for cryogenic silicon lenses

Judy Lau, Joseph Fowler, Tobias Marriage, Lyman Page, Jon Leong, Edward Wishnow, Ross Henry, Ed Wollack, Mark Halpern, Danica Marsden, Gaelen Marsden

Research output: Contribution to journal › Article › peer-review

61 Scopus citations

Abstract

We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5% at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4 K. We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.

Original language	English (US)
Pages (from-to)	3746-3751
Number of pages	6
Journal	Applied Optics
Volume	45
Issue number	16
DOIs	https://doi.org/10.1364/AO.45.003746
State	Published - Jun 1 2006

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.45.003746

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abstract = "We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5\% at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4 K. We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.",

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AU - Lau, Judy

AU - Fowler, Joseph

AU - Marriage, Tobias

AU - Page, Lyman

AU - Leong, Jon

AU - Wishnow, Edward

AU - Henry, Ross

AU - Wollack, Ed

AU - Halpern, Mark

AU - Marsden, Danica

AU - Marsden, Gaelen

PY - 2006/6/1

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N2 - We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5% at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4 K. We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.

AB - We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5% at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4 K. We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.

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Millimeter-wave antireflection coating for cryogenic silicon lenses

Abstract

All Science Journal Classification (ASJC) codes

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