Millimeter-wave antireflection coating for cryogenic silicon lenses

Judy Lau, Joseph Fowler, Tobias Marriage, Lyman Page, Jon Leong, Edward Wishnow, Ross Henry, Ed Wollack, Mark Halpern, Danica Marsden, Gaelen Marsden

Research output: Contribution to journalArticle

46 Scopus citations

Abstract

We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5% at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4 K. We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.

Original languageEnglish (US)
Pages (from-to)3746-3751
Number of pages6
JournalApplied Optics
Volume45
Issue number16
DOIs
StatePublished - Jun 1 2006

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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    Lau, J., Fowler, J., Marriage, T., Page, L., Leong, J., Wishnow, E., Henry, R., Wollack, E., Halpern, M., Marsden, D., & Marsden, G. (2006). Millimeter-wave antireflection coating for cryogenic silicon lenses. Applied Optics, 45(16), 3746-3751. https://doi.org/10.1364/AO.45.003746