Abstract
We have developed and tested an antireflection (AR) coating method for silicon lenses used at cryogenic temperatures and millimeter wavelengths. Our particular application is a measurement of the cosmic microwave background. The coating consists of machined pieces of Cirlex glued to the silicon. The measured reflection from an AR-coated flat piece is less than 1.5% at the design wavelength. The coating has been applied to flats and lenses and has survived multiple thermal cycles from 300 to 4 K. We present the manufacturing method, the material properties, the tests performed, and estimates of the loss that can be achieved in practical lenses.
Original language | English (US) |
---|---|
Pages (from-to) | 3746-3751 |
Number of pages | 6 |
Journal | Applied Optics |
Volume | 45 |
Issue number | 16 |
DOIs | |
State | Published - Jun 1 2006 |
All Science Journal Classification (ASJC) codes
- Engineering (miscellaneous)
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering