Mid-infrared surface plasmon coupled emitters utilizing intersublevel transitions in InAs quantum dots

Eric A. Shaner, Brandon S. Passmore, David Adams, Troy Ribaudo, Stephen A. Lyon, Weng Chow, Daniel Wasserman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate mid-infrared electroluminescence from intersublevel transitions in self-assembled InAs quantum dots coupled to surface plasmon modes on metal hole arrays. Subwavelength metal hole arrays with different periodicity are patterned into the top contact of the broadband (9 - 15 μm) quantum dot material and the measured electroluminescence is compared to devices without a metal hole array. The resulting normally directed emission is narrowed and a splitting in the spectral structure is observed. By applying a coupled quantum electrodynamic model and using reasonable values for quantum dot distributions and plasmon linewidths we are able to reproduce the experimentally measured spectral characteristics of device emission when using strong coupling parameters.

Original languageEnglish (US)
Title of host publicationActive Photonic Materials III
DOIs
StatePublished - Dec 1 2010
EventActive Photonic Materials III - San Diego, CA, United States
Duration: Aug 2 2010Aug 5 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7756
ISSN (Print)0277-786X

Other

OtherActive Photonic Materials III
CountryUnited States
CitySan Diego, CA
Period8/2/108/5/10

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Shaner, E. A., Passmore, B. S., Adams, D., Ribaudo, T., Lyon, S. A., Chow, W., & Wasserman, D. (2010). Mid-infrared surface plasmon coupled emitters utilizing intersublevel transitions in InAs quantum dots. In Active Photonic Materials III [77560Q] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7756). https://doi.org/10.1117/12.861060