Microwave-Frequency Scanning Gate Microscopy of a Si/SiGe Double Quantum Dot
- Artem O. Denisov
- , Seong W. Oh
- , Gordian Fuchs
- , Adam R. Mills
- , Pengcheng Chen
- , Christopher R. Anderson
- , Mark F. Gyure
- , Arthur W. Barnard
- , Jason R. Petta
Research output: Contribution to journal › Article › peer-review
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