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Microwave-Frequency Scanning Gate Microscopy of a Si/SiGe Double Quantum Dot
Artem O. Denisov, Seong W. Oh, Gordian Fuchs, Adam R. Mills, Pengcheng Chen, Christopher R. Anderson, Mark F. Gyure, Arthur W. Barnard, Jason R. Petta
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations