Abstract
We present the first microscopic calculations of the energetics of impurity-defect reactions and provide a detailed picture of the diffusion mechanisms of dopant impurities in Si. We find that vacancies mediate impurity diffusion via impurity-vacancy pairs. Self-interstitials mediate diffusion by ejecting substitutional impurities into interstitial channels and/or via impurity-self-interstitial pairs. The predicted activation energies for P and Al agree well with measured values in both intrinsic and extrinsic Si.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 360-363 |
| Number of pages | 4 |
| Journal | Physical review letters |
| Volume | 54 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1985 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy