Abstract
Self-interstitials in Si are known to migrate athermally at very low temperatures (-4 K). In contrast, at hightemperatures (1100-1600 K), self-diffusion has an activation energy of -5 eV. We describe results of self-consistent Green's-function total energy calculations which, for the first time, provide detailed microscopic understanding of the mechanisms underlying these phenomena and reconcile the contrasting low- and high-temperature data.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 401-407 |
| Number of pages | 7 |
| Journal | Physica B+C |
| Volume | 127 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - Dec 1984 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Engineering