Abstract
Self-interstitials in Si are known to migrate athermally at very low temperatures (-4 K). In contrast, at hightemperatures (1100-1600 K), self-diffusion has an activation energy of -5 eV. We describe results of self-consistent Green's-function total energy calculations which, for the first time, provide detailed microscopic understanding of the mechanisms underlying these phenomena and reconcile the contrasting low- and high-temperature data.
Original language | English (US) |
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Pages (from-to) | 401-407 |
Number of pages | 7 |
Journal | Physica B+C |
Volume | 127 |
Issue number | 1-3 |
DOIs | |
State | Published - Dec 1984 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Engineering