Abstract
Chemical functionalization of diamond surfaces by hydrogen is an important method for controlling the charge state of near-surface fluorescent color centers, an essential process in fabricating devices such as diamond field-effect transistors and chemical sensors, and a required first step for realizing families of more complex terminations through subsequent chemical processing. In all these cases, termination is typically achieved using hydrogen plasma sources that can etch or damage the diamond, as well as deposited materials or embedded color centers. This work explores alternative methods for lower-damage hydrogenation of diamond surfaces, specifically the annealing of diamond samples in high-purity, non-explosive mixtures of nitrogen and hydrogen gas, and the exposure of samples to microwave hydrogen plasmas in the absence of intentional stage heating. The effectiveness of these methods are characterized by x-ray photoelectron spectroscopy (XPS), and comparison of the results to density-functional modelling of the surface hydrogenation energetics implicates surface oxygen ligands as the primary factor limiting the termination quality of annealed samples. Finally, photoluminescence (PL) spectroscopy is used to verify that both the annealing and reduced sample temperature plasma methods are non-destructive to near-surface ensembles of nitrogen-vacancy (NV) centers, in stark contrast to plasma treatments that use heated sample stages.
| Original language | English (US) |
|---|---|
| Article number | 2400242 |
| Journal | Advanced Materials Interfaces |
| Volume | 11 |
| Issue number | 24 |
| DOIs | |
| State | Published - Aug 23 2024 |
All Science Journal Classification (ASJC) codes
- Mechanics of Materials
- Mechanical Engineering
Keywords
- X-ray photoelectron spectroscopy
- diamond
- forming gas
- hydrogen-termination
- nitrogen-vacancy
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