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Measuring the tip-sample separation in dynamic force microscopy
A. Bugacov
, R. Resch
, C. Baur
, N. Montoya
, K. Woronowicz
, A. Papson
, Bruce E. Koel
, A. Requicha
, P. Will
Chemical & Biological Engineering
High Meadows Environmental Institute
Princeton Materials Institute
Research output
:
Contribution to journal
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Article
›
peer-review
6
Scopus citations
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Engineering
Si Cantilever
100%
Actual Distance
100%
Dynamic Force
100%
Oscillation Cycle
100%
Keyphrases
Sample Separation
100%
Dynamic Force Microscopy
100%
Actual Distance
25%
Atomic Force Microscope Tips
25%
Optimal Height
25%
Oscillation Cycle
25%
Deflection Amplitude
25%
Si Cantilever
25%
Agricultural and Biological Sciences
Scanning Probe Microscopy
100%
Biochemistry, Genetics and Molecular Biology
Scanning Probe Microscopy
50%