TY - JOUR
T1 - Measuring errors in single-qubit rotations by pulsed electron paramagnetic resonance
AU - Morton, John J.L.
AU - Tyryshkin, Alexei M.
AU - Ardavan, Arzhang
AU - Porfyrakis, Kyriakos
AU - Lyon, S. A.
AU - Briggs, G. Andrew D.
PY - 2005/1/1
Y1 - 2005/1/1
N2 - The ability to measure and reduce systematic errors in single-qubit logic gates is crucial when evaluating quantum computing implementations. We describe pulsed electron paramagnetic resonance (EPR) sequences that can be used to measure precisely even small systematic errors in rotations of electron-spin-based qubits. Using these sequences we obtain values for errors in the rotation angle and axis for single-qubit rotations using a commercial EPR spectrometer. We conclude that errors in qubit operations by pulsed EPR are not limiting factors in the implementation of electron-spin-based quantum computers.
AB - The ability to measure and reduce systematic errors in single-qubit logic gates is crucial when evaluating quantum computing implementations. We describe pulsed electron paramagnetic resonance (EPR) sequences that can be used to measure precisely even small systematic errors in rotations of electron-spin-based qubits. Using these sequences we obtain values for errors in the rotation angle and axis for single-qubit rotations using a commercial EPR spectrometer. We conclude that errors in qubit operations by pulsed EPR are not limiting factors in the implementation of electron-spin-based quantum computers.
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U2 - 10.1103/PhysRevA.71.012332
DO - 10.1103/PhysRevA.71.012332
M3 - Article
AN - SCOPUS:18444380600
SN - 1050-2947
VL - 71
JO - Physical Review A - Atomic, Molecular, and Optical Physics
JF - Physical Review A - Atomic, Molecular, and Optical Physics
IS - 1
M1 - 012332
ER -