@inproceedings{7e0afe32e9d54f28849290931774f26b,
title = "Measurements of bolometer uniformity for feedhorn coupled TES polarimeters",
abstract = "We are developing feedhorn-coupled TES polarimeters to measure the polarization anisotropies of the cosmic microwave background (CMB) radiation. These devices will be deployed in arrays of hundreds to thousands and will be measured using multiplexed SQUID readout electronics. Since multiplexed devices share common circuitry, a high degree of uniformity is required in the electrothermal properties of the TES bolometers and readout circuits in order to operate all channels simultaneously with high sensitivity. Our cryogenic test bed can probe dozens of devices simultaneously, thus providing useful detector statistics on relatively short time scales. We describe the TES bolometer design and present dark (no optical loading) measurements of the electrical and thermal properties and uniformity of prototype bolometers across two 3-inch diameter production wafers, including (standard deviation in parenthesis): TES transition temperature (∼ 1%), normal resistance (∼ 10%), thermal conductance (≲ 10%), time constant (∼ 20%), shunt resistance (≲; 5%), and noise properties.",
keywords = "Bolometer, Cosmology, Detector array, Polarimeter, TES",
author = "Austermann, {J. E.} and Niemack, {M. D.} and Appel, {J. W.} and Beall, {J. A.} and D. Becker and Bennett, {D. A.} and Benson, {B. A.} and Bleem, {L. E.} and J. Britton and Carlstrom, {J. E.} and Chang, {C. L.} and Cho, {H. M.} and Crites, {A. T.} and T. Essinger-Hileman and W. Everett and Halverson, {N. W.} and Henning, {J. W.} and Hilton, {G. C.} and Irwin, {K. D.} and J. McMahon and J. Mehl and Meyer, {S. S.} and Parker, {L. P.} and Simon, {S. M.} and Staggs, {S. T.} and Ullom, {J. N.} and C. Visnjic and Yoon, {K. W.} and Y. Zhao",
year = "2009",
doi = "10.1063/1.3292388",
language = "English (US)",
isbn = "9780735407510",
series = "AIP Conference Proceedings",
pages = "498--501",
booktitle = "Low Temperature Detectors LTD-13 - Proceedings of the 13th International Workshop",
note = "13th International Workshop on Low Temperature Detectors, LTD-13 ; Conference date: 20-07-2009 Through 24-07-2009",
}