Abstract
We report the determination of the x-ray diffraction phase in 2D crystals, systems which are periodic in two dimensions and aperiodic in the third. The method consists of measuring the intensity of pairs of parallel, coherent diffracted beams, generated by an incident beam and a beam reflected from a gold mirror layer evaporated on the 2D crystal. Our experiments on an epitaxial GaAs/AlAs heterostructure with aperiodic layering demonstrate that it is possible to measure the phase. This opens the way for direct structural studies of a wide variety of 2D crystals.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1285-1288 |
| Number of pages | 4 |
| Journal | Physical review letters |
| Volume | 79 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jan 1 1997 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy