TY - JOUR
T1 - Measurement of particle/droplet size distributions by a laser diffraction technique.
AU - Felton, P. G.
PY - 1979
Y1 - 1979
N2 - The measurement of the size distribution of droplets and particles is a common problem in current technology. Many processes involve the production or use of particulate matter, e.g. crystallization, pigment manufacture, cement, combustion of pulverized coal and liquid fuel, aerosols, insecticide sprays etc. In such processes measurement and control of particle size is of great importance but on-line measurement of particle size distribution has not been possible until recently. An optical technique initially developed in this department and later in conjunction with Malvern Instruments Ltd., makes this possible. The technique uses the diffraction pattern formed when particles are illuminated by a parallel beam of monochromatic, coherent light to determine the particle size distribution. Special problems are encountered with monosized distributions, bimodal distributions and rapidly changing time dependent particle fields and techniques to deal with these are described.
AB - The measurement of the size distribution of droplets and particles is a common problem in current technology. Many processes involve the production or use of particulate matter, e.g. crystallization, pigment manufacture, cement, combustion of pulverized coal and liquid fuel, aerosols, insecticide sprays etc. In such processes measurement and control of particle size is of great importance but on-line measurement of particle size distribution has not been possible until recently. An optical technique initially developed in this department and later in conjunction with Malvern Instruments Ltd., makes this possible. The technique uses the diffraction pattern formed when particles are illuminated by a parallel beam of monochromatic, coherent light to determine the particle size distribution. Special problems are encountered with monosized distributions, bimodal distributions and rapidly changing time dependent particle fields and techniques to deal with these are described.
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M3 - Article
AN - SCOPUS:18144437117
SN - 0402-1215
JO - [No source information available]
JF - [No source information available]
ER -