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Measurement of High Density Electrons Above a Helium Film on an Amorphous Metal Substrate
K. E. Castoria
,
S. A. Lyon
Electrical and Computer Engineering
Princeton Materials Institute
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Keyphrases
High Density
100%
Metallic Substrate
100%
Metal Substrate
100%
Amorphous Metals
100%
Helium Films
100%
Electron Density
50%
Two-dimensional Electron Systems
50%
Work Function
50%
Uniform Density
50%
Kelvin Probe Method
50%
Low Surface Roughness
50%
Amorphous Metallic Alloys
50%
Material Science
Density
100%
Carrier Concentration
100%
Amorphous Metal
100%
Helium
100%
Film
50%
Surface Roughness
50%
Alloy
50%
Physics
Electron Density
100%
Helium Film
100%
Work Function
50%
Surface Roughness
50%
Alloy
50%