Measurement and control of ultrafast relaxation in the fine structure of nanocrystal excitons

Cathy Y. Wong, Jeongho Kim, Gregory D. Scholes

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report studies of relaxation processes through the fine structure of the first excitonic state of semiconductor nanocrystals. A cross polarized, third-order transient grating method is used, and results are simulated using a kinetic model.

Original languageEnglish (US)
Title of host publicationLaser Science, LS 2008
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528612
DOIs
StatePublished - 2008
Externally publishedYes
EventLaser Science, LS 2008 - Rochester, NY, United States
Duration: Oct 19 2008Oct 23 2008

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherLaser Science, LS 2008
Country/TerritoryUnited States
CityRochester, NY
Period10/19/0810/23/08

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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