Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)

C. N. Taylor; B. Heim; S. Gonderman; J. P. Allain; Z. Yang; R. Kaita; A. L. Roquemore; C. H. Skinner; R. A. Ellis

doi:10.1063/1.4729262

Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)

C. N. Taylor
, B. Heim
, S. Gonderman
, J. P. Allain
, Z. Yang
, R. Kaita
, A. L. Roquemore
, C. H. Skinner
, R. A. Ellis

PPPL Engineering

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPPs XPS and TDS capabilities.

Original language	English (US)
Article number	10D703
Journal	Review of Scientific Instruments
Volume	83
Issue number	10
DOIs	https://doi.org/10.1063/1.4729262
State	Published - Oct 2012

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.4729262

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title = "Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)",

abstract = "The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPPs XPS and TDS capabilities.",

author = "Taylor, \{C. N.\} and B. Heim and S. Gonderman and Allain, \{J. P.\} and Z. Yang and R. Kaita and Roquemore, \{A. L.\} and Skinner, \{C. H.\} and Ellis, \{R. A.\}",

year = "2012",

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doi = "10.1063/1.4729262",

language = "English (US)",

volume = "83",

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T2 - A compact diagnostic system for in situ analysis of plasma-facing components (invited)

AU - Taylor, C. N.

AU - Heim, B.

AU - Gonderman, S.

AU - Allain, J. P.

AU - Yang, Z.

AU - Kaita, R.

AU - Roquemore, A. L.

AU - Skinner, C. H.

AU - Ellis, R. A.

PY - 2012/10

Y1 - 2012/10

N2 - The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPPs XPS and TDS capabilities.

AB - The objective of the materials analysis particle probe (MAPP) in NSTX is to enable prompt and direct analysis of plasma-facing components exposed to plasma discharges. MAPP allows multiple samples to be introduced to the level of the plasma-facing surface without breaking vacuum and analyzed using X-ray photoelectron spectroscopy (XPS), ion-scattering and direct recoil spectroscopy, and thermal desorption spectroscopy (TDS) immediately following the plasma discharge. MAPP is designed to operate as a diagnostic within the ∼12 min NSTX minimum between-shot time window to reveal fundamental plasma-surface interactions. Initial calibration demonstrates MAPPs XPS and TDS capabilities.

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AN - SCOPUS:84868368951

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JO - Review of Scientific Instruments

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IS - 10

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ER -

Materials analysis and particle probe: A compact diagnostic system for in situ analysis of plasma-facing components (invited)

Abstract

All Science Journal Classification (ASJC) codes

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