Abstract
The single ion Penning trap mass spectrometer at M.I.T. now compares masses with an accuracy of 0.1 part per billion. We have created a table of fundamental atomic masses and made measurements useful for calibrating the X-ray wavelength standard, and determining Avogadro's number, the molar Planck constant, and the fine structure constant.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 550-552 |
| Number of pages | 3 |
| Journal | IEEE Transactions on Instrumentation and Measurement |
| Volume | 44 |
| Issue number | 2 |
| DOIs | |
| State | Published - Apr 1995 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Instrumentation
- Electrical and Electronic Engineering