Abstract
The single ion Penning trap mass spectrometer at M.I.T. now compares masses with an accuracy of 0.1 part per billion. We have created a table of fundamental atomic masses and made measurements useful for calibrating the X-ray wavelength standard, and determining Avogadro's number, the molar Planck constant, and the fine structure constant.
Original language | English (US) |
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Pages (from-to) | 550-552 |
Number of pages | 3 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 44 |
Issue number | 2 |
DOIs | |
State | Published - Apr 1995 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Instrumentation
- Electrical and Electronic Engineering