Mass Spectrometry at 0.1 Part Per Billion for Fundamental Metrology

Frank DiFilippo, Vasant Natarajan, Michael Bradley, Fred Palmer, Szymon Rusinkiewicz, David E. Pritchard

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The single ion Penning trap mass spectrometer at M.I.T. now compares masses with an accuracy of 0.1 part per billion. We have created a table of fundamental atomic masses and made measurements useful for calibrating the X-ray wavelength standard, and determining Avogadro's number, the molar Planck constant, and the fine structure constant.

Original languageEnglish (US)
Pages (from-to)550-552
Number of pages3
JournalIEEE Transactions on Instrumentation and Measurement
Volume44
Issue number2
DOIs
StatePublished - Apr 1995
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Mass Spectrometry at 0.1 Part Per Billion for Fundamental Metrology'. Together they form a unique fingerprint.

Cite this