TY - JOUR
T1 - Manipulation of nanoparticles using dynamic force microscopy
T2 - Simulation and experiments
AU - Resch, R.
AU - Bugacov, A.
AU - Baur, C.
AU - Koel, B. E.
AU - Madhukar, A.
AU - Requicha, A. A.G.
AU - Will, P.
PY - 1998
Y1 - 1998
N2 - Dynamic force microscopy (DFM) in combination with special-purpose probe control software is used as a manipulation tool for the precise positioning of single gold nanoparticles on a mica substrate covered with a poly-L-lysine film. Experimental results are presented that show how to construct arbitrary patterns of nanoparticles. The dynamic state of the cantilever during the manipulation process is studied experimentally by analyzing the simultaneously recorded non-contact amplitude and cantilever deflection. Numerical simulations guide and supplement the experiments in order to provide a physical description of the manipulation mechanism. The results presented here show that the nanoparticles are pushed along the surface once a critical contact force between tip and gold cluster is exceeded. In addition, a method for estimating the average separation between the tip apex and the sample in DFM is described.
AB - Dynamic force microscopy (DFM) in combination with special-purpose probe control software is used as a manipulation tool for the precise positioning of single gold nanoparticles on a mica substrate covered with a poly-L-lysine film. Experimental results are presented that show how to construct arbitrary patterns of nanoparticles. The dynamic state of the cantilever during the manipulation process is studied experimentally by analyzing the simultaneously recorded non-contact amplitude and cantilever deflection. Numerical simulations guide and supplement the experiments in order to provide a physical description of the manipulation mechanism. The results presented here show that the nanoparticles are pushed along the surface once a critical contact force between tip and gold cluster is exceeded. In addition, a method for estimating the average separation between the tip apex and the sample in DFM is described.
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U2 - 10.1007/s003390050769
DO - 10.1007/s003390050769
M3 - Article
AN - SCOPUS:0032157221
SN - 0947-8396
VL - 67
SP - 265
EP - 271
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
IS - 3
ER -