Magnetic anisotropy of epitaxial cobalt ferrite thin films

Y. Suzuki, G. Hu, R. B. Van Dover, R. J. Cava

Research output: Contribution to journalArticle

118 Scopus citations

Abstract

We have fabricated epitaxial single crystalline cobalt ferrite (CoFe2O4) thin films on CoCr2O4 buffered SrTiO3 and MgAl2O4 substrates. Structural characterization by X-ray diffraction, Rutherford backscattering spectroscopy and atomic force microscopy indicates excellent crystallinity. Magnetic anisotropy measurements in the in-plane and perpendicular directions as a function of film thickness provide strong evidence for the dominant role of strain in the magnetic anisotropy. Cobalt ferrite (1 0 0) films grown under compression have an easy [0 0 1] and hard [0 1 1] direction in the plane and [1 0 0] direction out of the plane of the film. Cobalt ferrite (1 1 0) films grown under compression give rise to an easy [0 0 1] and a hard [1 1̄ 0] directions in the plane of the film and a hard axis perpendicular to the film. Films grown under tension give rise to an easy axis perpendicular to the film. These observations are explained using magneto-elastic theory.

Original languageEnglish (US)
Pages (from-to)1-8
Number of pages8
JournalJournal of Magnetism and Magnetic Materials
Volume191
Issue number1-2
DOIs
StatePublished - Jan 1 1999

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Keywords

  • Anisotropy-magnetic
  • Cobalt ferrite
  • Epitaxial thin films

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