We have fabricated epitaxial single crystalline cobalt ferrite (CoFe2O4) thin films on CoCr2O4 buffered SrTiO3 and MgAl2O4 substrates. Structural characterization by X-ray diffraction, Rutherford backscattering spectroscopy and atomic force microscopy indicates excellent crystallinity. Magnetic anisotropy measurements in the in-plane and perpendicular directions as a function of film thickness provide strong evidence for the dominant role of strain in the magnetic anisotropy. Cobalt ferrite (1 0 0) films grown under compression have an easy [0 0 1] and hard [0 1 1] direction in the plane and [1 0 0] direction out of the plane of the film. Cobalt ferrite (1 1 0) films grown under compression give rise to an easy [0 0 1] and a hard [1 1̄ 0] directions in the plane of the film and a hard axis perpendicular to the film. Films grown under tension give rise to an easy axis perpendicular to the film. These observations are explained using magneto-elastic theory.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Cobalt ferrite
- Epitaxial thin films