Low overhead design for testability and test generation technique for core-based systems

Engineering & Materials Science

• Design for testability 77%
• Discrete Fourier transforms 61%
• Core levels 44%
• Systems analysis 42%
• Byproducts 29%
• Testing 28%
• Industry 12%
• Costs 10%
• Experiments 9%

Mathematics

• Test Generation 100%
• Design 34%
• Test System 17%
• System Design 14%
• Chip 14%
• Testing 7%
• Design Methodology 7%
• Test Set 7%
• Fault 6%
• Insertion 6%
• Industry 5%
• Market 5%
• Level Set 5%
• Justification 5%
• Coverage 5%
• Paradigm 5%
• Propagation 5%
• Entire 4%
• Experiment 4%
• Output 4%
• Costs 4%