Low overhead design for testability and test generation technique for core-based systems

Indradeep Ghosh, Niraj Kumar Jha, Sujit Dey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

29 Scopus citations

Abstract

In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has several advantages in terms of time-to-market and system cost, testing such core-based systems is difficult due to the problem of justifying test sequences at the inputs of a core embedded deep in the system, and propagating test responses from the core outputs. In this paper, we present a design for testability and symbolic test generation technique for testing such core-based systems on a chip. The proposed method consists of two parts: (i) Core-level DFT to make each core testable and transparent, the latter needed to propagate test data through the cores, and (ii) System-level DFT and test generation to ensure the justification and propagation of the precomputed test sequences and test responses of the core. Since the hierarchical testability analysis technique used to tackle the above problem is symbolic, the system test generation method is independent of the bit-width of the cores. The system-level test set is obtained as a by-product of the testability analysis and insertion method without further search. Besides the proposed test method, the two methods that are currently used in the industry were also evaluated on two example systems: (i) FScan-BScan, where each core is full-scanned, and system test is performed using boundary scan, and (ii) FScan-TBus, where each core is full-scanned, and system test is performed using a test bus. The experiments show that the proposed scheme has significantly lower area overhead, delay overhead, and test application time compared to FScan-BScan and FScan-TBus, without any compromise in the system fault coverage.

Original languageEnglish (US)
Title of host publicationIEEE International Test Conference (TC)
Editors Anon
Pages50-59
Number of pages10
DOIs
StatePublished - Dec 1 1997
EventProceedings of the 1997 IEEE International Test Conference - Washington, DC, USA
Duration: Nov 3 1997Nov 5 1997

Publication series

NameIEEE International Test Conference (TC)
ISSN (Print)1089-3539

Other

OtherProceedings of the 1997 IEEE International Test Conference
CityWashington, DC, USA
Period11/3/9711/5/97

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

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  • Cite this

    Ghosh, I., Jha, N. K., & Dey, S. (1997). Low overhead design for testability and test generation technique for core-based systems. In Anon (Ed.), IEEE International Test Conference (TC) (pp. 50-59). (IEEE International Test Conference (TC)). https://doi.org/10.1109/TEST.1997.639593