Low-frequency dielectric response of the charge-density wave in (TaSe4)2I

R. J. Cava, P. Littlewood, R. M. Fleming, R. G. Dunn, E. A. Rietman

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Abstract

We have found the charge-density wave (CDW) in (TaSe4)2I to display a low-frequency dielectric relaxation characterized by a distribution of relaxation times. The mean relaxation times vary between approximately 10-4 and 10-8 sec in the temperature range of 90 to 180 K, and display an Arrhenius temperature dependence with the same activation energy (1436 K) as the normal resistivity. This is the only material thus far studied where such a straightforward connection between CDW relaxation and the band gap has been observed.

Original languageEnglish (US)
Pages (from-to)2439-2443
Number of pages5
JournalPhysical Review B
Volume33
Issue number4
DOIs
StatePublished - Jan 1 1986
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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    Cava, R. J., Littlewood, P., Fleming, R. M., Dunn, R. G., & Rietman, E. A. (1986). Low-frequency dielectric response of the charge-density wave in (TaSe4)2I. Physical Review B, 33(4), 2439-2443. https://doi.org/10.1103/PhysRevB.33.2439