Loss of constraint on fracture in thin film structures due to creep

R. Huang; J. H. Prévost; Z. Suo

doi:10.1016/S1359-6454(02)00252-5

Loss of constraint on fracture in thin film structures due to creep

R. Huang, J. H. Prévost, Z. Suo

Civil & Environmental Engineering

Research output: Contribution to journal › Article › peer-review

39 Scopus citations

Abstract

Fracture in thin films is normally constrained by the substrates. If the substrate creeps, however, the constraint will be lost over time. This paper presents a two-dimensional model for channel cracks in an elastic film on a viscous layer, and implements an extended finite element method to evolve the displacement field and the stress intensity factor with relatively coarse meshes. Solutions are obtained for stress intensity factors of channel cracks with several in-plane geometries. The stress intensity factor increases with time, indicating the loss of constraint. Several scaling laws are obtained. Extensions of the present model are outlined for nonlinear creeping and viscoelastic layers, as well as a thick viscous substrate. Fracture in thin film structures subjected to ratcheting deformation under cyclic temperatures using the analogy between creeping and ratcheting is also discussed.

Original language	English (US)
Pages (from-to)	4137-4148
Number of pages	12
Journal	Acta Materialia
Volume	50
Issue number	16
DOIs	https://doi.org/10.1016/S1359-6454(02)00252-5
State	Published - Sep 20 2002

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Polymers and Plastics
Metals and Alloys

Keywords

Creep
Fracture
Thin film

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10.1016/S1359-6454(02)00252-5

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title = "Loss of constraint on fracture in thin film structures due to creep",

abstract = "Fracture in thin films is normally constrained by the substrates. If the substrate creeps, however, the constraint will be lost over time. This paper presents a two-dimensional model for channel cracks in an elastic film on a viscous layer, and implements an extended finite element method to evolve the displacement field and the stress intensity factor with relatively coarse meshes. Solutions are obtained for stress intensity factors of channel cracks with several in-plane geometries. The stress intensity factor increases with time, indicating the loss of constraint. Several scaling laws are obtained. Extensions of the present model are outlined for nonlinear creeping and viscoelastic layers, as well as a thick viscous substrate. Fracture in thin film structures subjected to ratcheting deformation under cyclic temperatures using the analogy between creeping and ratcheting is also discussed.",

keywords = "Creep, Fracture, Thin film",

author = "R. Huang and Pr{\'e}vost, {J. H.} and Z. Suo",

note = "Funding Information: The work is supported by the National Science Foundation through grants CMS-9820713 and CMS-9988788 with Drs Ken Chong and Jorn Larsen-Basse as the program directors, and by the New Jersey Science and Technology Commission. We thank Dr N. Sukumar for helpful discussions about the extended finite element method.",

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doi = "10.1016/S1359-6454(02)00252-5",

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T1 - Loss of constraint on fracture in thin film structures due to creep

AU - Huang, R.

AU - Prévost, J. H.

AU - Suo, Z.

N1 - Funding Information: The work is supported by the National Science Foundation through grants CMS-9820713 and CMS-9988788 with Drs Ken Chong and Jorn Larsen-Basse as the program directors, and by the New Jersey Science and Technology Commission. We thank Dr N. Sukumar for helpful discussions about the extended finite element method.

PY - 2002/9/20

Y1 - 2002/9/20

N2 - Fracture in thin films is normally constrained by the substrates. If the substrate creeps, however, the constraint will be lost over time. This paper presents a two-dimensional model for channel cracks in an elastic film on a viscous layer, and implements an extended finite element method to evolve the displacement field and the stress intensity factor with relatively coarse meshes. Solutions are obtained for stress intensity factors of channel cracks with several in-plane geometries. The stress intensity factor increases with time, indicating the loss of constraint. Several scaling laws are obtained. Extensions of the present model are outlined for nonlinear creeping and viscoelastic layers, as well as a thick viscous substrate. Fracture in thin film structures subjected to ratcheting deformation under cyclic temperatures using the analogy between creeping and ratcheting is also discussed.

AB - Fracture in thin films is normally constrained by the substrates. If the substrate creeps, however, the constraint will be lost over time. This paper presents a two-dimensional model for channel cracks in an elastic film on a viscous layer, and implements an extended finite element method to evolve the displacement field and the stress intensity factor with relatively coarse meshes. Solutions are obtained for stress intensity factors of channel cracks with several in-plane geometries. The stress intensity factor increases with time, indicating the loss of constraint. Several scaling laws are obtained. Extensions of the present model are outlined for nonlinear creeping and viscoelastic layers, as well as a thick viscous substrate. Fracture in thin film structures subjected to ratcheting deformation under cyclic temperatures using the analogy between creeping and ratcheting is also discussed.

KW - Creep

KW - Fracture

KW - Thin film

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U2 - 10.1016/S1359-6454(02)00252-5

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M3 - Article

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EP - 4148

JO - Acta Materialia

JF - Acta Materialia

IS - 16

ER -

Loss of constraint on fracture in thin film structures due to creep

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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