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Limited-thickness epitaxy of semiconductors down to room temperature
D. J. Eaglesham
, H. J. Gossmann
, M. Cerullo
,
L. N. Pfeiffer
, D. Windt
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
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Keyphrases
Room Temperature
100%
Semiconductors
100%
Epitaxy
100%
Molecular Beam Epitaxy
60%
SiGe
40%
Surface Roughness
40%
Low Temperature
20%
Epitaxial
20%
Gallium Arsenide
20%
Surface Morphology
20%
Diffusion Process
20%
Amorphous Phase
20%
Defect Density
20%
Surface Diffusion
20%
Slow Change
20%
Low Temperature Limit
20%
Marker Layer
20%
Temperature Limitation
20%
Crystalline Surface
20%
Low Temperature Measurements
20%
TEM Measurements
20%
Doping Experiments
20%
Material Science
Epitaxy
100%
Molecular Beam Epitaxy
60%
Surface Roughness
40%
Film
20%
Gallium Arsenide
20%
Nucleation
20%
Defect Density
20%
Surface Diffusion
20%
Surface Morphology
20%