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Latent Representation of Microstructures Using Variational Autoencoders with Spatial Statistics-Space Loss

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We propose the use of Cross-Entropy on 2-point spatial statistics (CESS) as a reconstruction loss term for a variational autoencoder, creating a small latent-space representation of microstructures from which microstructures can be reconstructed. A prospective application of small reversible microstructure representations is more efficient optimization for materials properties in latent space. In Materials Science, 2-point spatial statistics have been shown to be good representations of microstructure properties, and have many desirable invariances (translation, phase label, inversion). To our knowledge, we are the first to demonstrate a system that successfully creates latent representations of realistic simulations of microstructures by using an error term that minimizes the distance between input and reconstruction in spatial statistics space. We also demonstrate some promising preliminary qualitative results that show improved quality of reconstructions using CESS loss. We demonstrate compression from 224×224 binary microstructure images to 14×14 latent representations.

Original languageEnglish (US)
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3155-3161
Number of pages7
ISBN (Electronic)9798331589882
DOIs
StatePublished - 2025
Externally publishedYes
Event2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025 - Honolulu, United States
Duration: Oct 19 2025Oct 20 2025

Publication series

NameProceedings - 2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision Workshops, ICCV-W 2025
Country/TerritoryUnited States
CityHonolulu
Period10/19/2510/20/25

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

Keywords

  • Latent representation
  • Microstructure
  • Vae

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