Laser-micromachined defect arrays for DC potential drop fatigue studies

Craig B. Arnold, B. Pratap, A. Piqué, A. B. Geltmacher, J. P. Thomas

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

The experimental characterization of fatigue crack initiation and growth of structural materials can be very expensive and time consuming. Fatigue specimens are typically controlled by a single dominant defect and several specimens are needed to examine the fatigue response for each loading condition of interest. Time and expense add up as millions of load cycles are sometimes required to initiate a crack, and replicate tests are necessary to characterize the inherent statistical nature of fatigue. In order to improve the efficiency of experimentation, we are developing laser-based techniques to produce fatigue test samples with arrays of defects. Controlled arrays of oval shaped micro-defects are laser-micromachined in titanium alloy (Ti-6Al-4V). Crack initiation from the individual defects in the arrays is monitored using a DC potential drop technique. Results indicate the utility of this approach in multiplying the amount of fatigue data generated per specimen-test. The new fatigue test approach is applicable to a wide range of material systems and initial defect structures.

Original languageEnglish (US)
Pages (from-to)298-303
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5339
DOIs
StatePublished - 2004
EventPhoton Processing in Microelectronics and Photonics III - San Jose, CA, United States
Duration: Jan 26 2004Jan 29 2004

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Laser-micromachined defect arrays for DC potential drop fatigue studies'. Together they form a unique fingerprint.

Cite this