Laser ablation loading of a surface-electrode ion trap

David R. Leibrandt; Robert J. Clark; Jaroslaw Labaziewicz; Paul Antohi; Waseem Bakr; Kenneth R. Brown; Isaac L. Chuang

doi:10.1103/PhysRevA.76.055403

Laser ablation loading of a surface-electrode ion trap

David R. Leibrandt, Robert J. Clark, Jaroslaw Labaziewicz, Paul Antohi, Waseem Bakr, Kenneth R. Brown, Isaac L. Chuang

Research output: Contribution to journal › Article › peer-review

45 Scopus citations

Abstract

We demonstrate loading of Sr+88 ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 4 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful (500 meV).

Original language	English (US)
Article number	055403
Journal	Physical Review A - Atomic, Molecular, and Optical Physics
Volume	76
Issue number	5
DOIs	https://doi.org/10.1103/PhysRevA.76.055403
State	Published - Nov 8 2007
Externally published	Yes

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1103/PhysRevA.76.055403

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title = "Laser ablation loading of a surface-electrode ion trap",

abstract = "We demonstrate loading of Sr+88 ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 4 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful (500 meV).",

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AU - Leibrandt, David R.

AU - Clark, Robert J.

AU - Labaziewicz, Jaroslaw

AU - Antohi, Paul

AU - Bakr, Waseem

AU - Brown, Kenneth R.

AU - Chuang, Isaac L.

PY - 2007/11/8

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N2 - We demonstrate loading of Sr+88 ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 4 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful (500 meV).

AB - We demonstrate loading of Sr+88 ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 4 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful (500 meV).

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Laser ablation loading of a surface-electrode ion trap

Abstract

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