Laser ablation loading of a surface-electrode ion trap

David R. Leibrandt, Robert J. Clark, Jaroslaw Labaziewicz, Paul Antohi, Waseem Bakr, Kenneth R. Brown, Isaac L. Chuang

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

We demonstrate loading of Sr+88 ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 4 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful (500 meV).

Original languageEnglish (US)
Article number055403
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume76
Issue number5
DOIs
StatePublished - Nov 8 2007
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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