Abstract
Large area direct nanoimprinting of SiO2-TiO2 gel gratings for optical applications were investigated. An economical way of fabricating gel-film based devices by combining nanoimprint lithography (NIL) and a sol-gel technique was presented. Atomic force microscopy results of surface roughness measurements of waveguide gratings showed smooth profiles with root mean square roughness less than 6 nm.
Original language | English (US) |
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Pages (from-to) | 660-663 |
Number of pages | 4 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 21 |
Issue number | 2 |
State | Published - Mar 2003 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electrical and Electronic Engineering