Laboratory Observation of Resistive Electron Tearing in a Two-Fluid Reconnecting Current Sheet

Jonathan Jara-Almonte, Hantao Ji, Masaaki Yamada, Jongsoo Yoo, William Fox

Research output: Contribution to journalArticle

19 Scopus citations

Abstract

The spontaneous formation of plasmoids via the resistive electron tearing of a reconnecting current sheet is observed in the laboratory. These experiments are performed during driven, antiparallel reconnection in the two-fluid regime within the Magnetic Reconnection Experiment. It is found that plasmoids are present even at a very low Lundquist number, and the number of plasmoids scales with both the current sheet aspect ratio and the Lundquist number. The reconnection electric field increases when plasmoids are formed, leading to an enhanced reconnection rate.

Original languageEnglish (US)
Article number095001
JournalPhysical review letters
Volume117
Issue number9
DOIs
StatePublished - Aug 25 2016

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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