Kondo effect in electromigrated gold break junctions

A. A. Houck; J. Labaziewicz; E. K. Chan; J. A. Folk; I. L. Chuang

doi:10.1021/nl050799i

Kondo effect in electromigrated gold break junctions

A. A. Houck, J. Labaziewicz, E. K. Chan, J. A. Folk, I. L. Chuang

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134 Scopus citations

Abstract

We present gate-dependent transport measurements of Kondo impurities in bare gold break junctions, generated with high yield using an electromigration process that is actively controlled. Thirty percent of measured devices show zero-bias conductance peaks. Temperature dependence suggests Kondo temperatures ∼7 K. The peak splitting in magnetic field is consistent with theoretical predictions for g = 2, though in many devices the splitting is offset from 2gμ _BB by a fixed energy. The Kondo resonances observed here may be due to atomicscale metallic grains formed during electromigration.

Original language	English (US)
Pages (from-to)	1685-1688
Number of pages	4
Journal	Nano Letters
Volume	5
Issue number	9
DOIs	https://doi.org/10.1021/nl050799i
State	Published - Sep 2005
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Chemistry
Condensed Matter Physics
Mechanical Engineering
Bioengineering
General Materials Science

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10.1021/nl050799i

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@article{45df6b03158c4b8695b18ec7fff8d97e,

title = "Kondo effect in electromigrated gold break junctions",

abstract = "We present gate-dependent transport measurements of Kondo impurities in bare gold break junctions, generated with high yield using an electromigration process that is actively controlled. Thirty percent of measured devices show zero-bias conductance peaks. Temperature dependence suggests Kondo temperatures ∼7 K. The peak splitting in magnetic field is consistent with theoretical predictions for g = 2, though in many devices the splitting is offset from 2gμ BB by a fixed energy. The Kondo resonances observed here may be due to atomicscale metallic grains formed during electromigration.",

author = "Houck, {A. A.} and J. Labaziewicz and Chan, {E. K.} and Folk, {J. A.} and Chuang, {I. L.}",

year = "2005",

month = sep,

doi = "10.1021/nl050799i",

language = "English (US)",

volume = "5",

pages = "1685--1688",

journal = "Nano Letters",

issn = "1530-6984",

publisher = "American Chemical Society",

number = "9",

}

TY - JOUR

T1 - Kondo effect in electromigrated gold break junctions

AU - Houck, A. A.

AU - Labaziewicz, J.

AU - Chan, E. K.

AU - Folk, J. A.

AU - Chuang, I. L.

PY - 2005/9

Y1 - 2005/9

N2 - We present gate-dependent transport measurements of Kondo impurities in bare gold break junctions, generated with high yield using an electromigration process that is actively controlled. Thirty percent of measured devices show zero-bias conductance peaks. Temperature dependence suggests Kondo temperatures ∼7 K. The peak splitting in magnetic field is consistent with theoretical predictions for g = 2, though in many devices the splitting is offset from 2gμ BB by a fixed energy. The Kondo resonances observed here may be due to atomicscale metallic grains formed during electromigration.

AB - We present gate-dependent transport measurements of Kondo impurities in bare gold break junctions, generated with high yield using an electromigration process that is actively controlled. Thirty percent of measured devices show zero-bias conductance peaks. Temperature dependence suggests Kondo temperatures ∼7 K. The peak splitting in magnetic field is consistent with theoretical predictions for g = 2, though in many devices the splitting is offset from 2gμ BB by a fixed energy. The Kondo resonances observed here may be due to atomicscale metallic grains formed during electromigration.

UR - http://www.scopus.com/inward/record.url?scp=25844487633&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=25844487633&partnerID=8YFLogxK

U2 - 10.1021/nl050799i

DO - 10.1021/nl050799i

M3 - Article

C2 - 16159205

AN - SCOPUS:25844487633

SN - 1530-6984

VL - 5

SP - 1685

EP - 1688

JO - Nano Letters

JF - Nano Letters

IS - 9

ER -

Kondo effect in electromigrated gold break junctions

Abstract

All Science Journal Classification (ASJC) codes

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