Kinetic study of low temperature oxidation of N-pentane with nitric oxide addition in a jet stirred reactor

Hao Zhao; Lingnan Wu; Charles Patrick; Zunhua Zhang; Yacine Rezgui; Gerard Wysocki; Yiguang Ju

Kinetic study of low temperature oxidation of N-pentane with nitric oxide addition in a jet stirred reactor

Hao Zhao, Lingnan Wu, Charles Patrick, Zunhua Zhang, Yacine Rezgui, Gerard Wysocki, Yiguang Ju

Research output: Contribution to conference › Paper › peer-review

Abstract

The low temperature oxidation of n-pentane with nitric oxide (NO) addition from 400K to 800K has been investigated in an atmospheric jet stirred reactor (JSR). The concentration of NO is varied from 0 to 1070ppm in the mixture to study its sensitization effect on the n-pentane oxidation. n-pentane, O₂, CO, CO₂, CH₂O, CH₂O, C₂H₄, CH₃CHO, H₂O₂, NO, and NO₂ are in-situ quantified by using the molecular beam mass spectrometer (MBMS), micro-gas chromatography (µ-GC), and the transportable dual-modulation faraday rotation spectrometer (DM-FRS) simultaneously. The experimental results reveal that the presence of NO inhibits and promotes the oxidation of n-pentane at lower and higher temperatures, respectively, and has a significant effect on the oxidation initiation temperature and negative temperature coefficient (NTC) behavior of n-pentane. A new NO sensitized n-pentane mechanism, consists of a existing n-pentane base mechanism with an appropriate addition of our NOx sub-mechanism, is developed and refined to predict the experimental results. The key features of NO sensitized n-pentane oxidation are captured in the model and the kinetic effect of NO sensitization is detailed analyzed with varied temperatures.

Original language	English (US)
State	Published - 2017
Event	10th U.S. National Combustion Meeting - College Park, United States Duration: Apr 23 2017 → Apr 26 2017

Other

Other	10th U.S. National Combustion Meeting
Country/Territory	United States
City	College Park
Period	4/23/17 → 4/26/17

All Science Journal Classification (ASJC) codes

General Chemical Engineering
Physical and Theoretical Chemistry
Mechanical Engineering

Keywords

Jet stirred reactor
Low temperature chemistry
NO sensitization
n-pentane oxidation

Cite this

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title = "Kinetic study of low temperature oxidation of N-pentane with nitric oxide addition in a jet stirred reactor",

abstract = "The low temperature oxidation of n-pentane with nitric oxide (NO) addition from 400K to 800K has been investigated in an atmospheric jet stirred reactor (JSR). The concentration of NO is varied from 0 to 1070ppm in the mixture to study its sensitization effect on the n-pentane oxidation. n-pentane, O2, CO, CO2, CH2O, CH2O, C2H4, CH3CHO, H2O2, NO, and NO2 are in-situ quantified by using the molecular beam mass spectrometer (MBMS), micro-gas chromatography (µ-GC), and the transportable dual-modulation faraday rotation spectrometer (DM-FRS) simultaneously. The experimental results reveal that the presence of NO inhibits and promotes the oxidation of n-pentane at lower and higher temperatures, respectively, and has a significant effect on the oxidation initiation temperature and negative temperature coefficient (NTC) behavior of n-pentane. A new NO sensitized n-pentane mechanism, consists of a existing n-pentane base mechanism with an appropriate addition of our NOx sub-mechanism, is developed and refined to predict the experimental results. The key features of NO sensitized n-pentane oxidation are captured in the model and the kinetic effect of NO sensitization is detailed analyzed with varied temperatures.",

keywords = "Jet stirred reactor, Low temperature chemistry, NO sensitization, n-pentane oxidation",

author = "Hao Zhao and Lingnan Wu and Charles Patrick and Zunhua Zhang and Yacine Rezgui and Gerard Wysocki and Yiguang Ju",

note = "Publisher Copyright: {\textcopyright} 2017 Eastern States Section of the Combustion Institute. All rights reserved.; 10th U.S. National Combustion Meeting ; Conference date: 23-04-2017 Through 26-04-2017",

year = "2017",

language = "English (US)",

}

TY - CONF

T1 - Kinetic study of low temperature oxidation of N-pentane with nitric oxide addition in a jet stirred reactor

AU - Zhao, Hao

AU - Wu, Lingnan

AU - Patrick, Charles

AU - Zhang, Zunhua

AU - Rezgui, Yacine

AU - Wysocki, Gerard

AU - Ju, Yiguang

PY - 2017

Y1 - 2017

N2 - The low temperature oxidation of n-pentane with nitric oxide (NO) addition from 400K to 800K has been investigated in an atmospheric jet stirred reactor (JSR). The concentration of NO is varied from 0 to 1070ppm in the mixture to study its sensitization effect on the n-pentane oxidation. n-pentane, O2, CO, CO2, CH2O, CH2O, C2H4, CH3CHO, H2O2, NO, and NO2 are in-situ quantified by using the molecular beam mass spectrometer (MBMS), micro-gas chromatography (µ-GC), and the transportable dual-modulation faraday rotation spectrometer (DM-FRS) simultaneously. The experimental results reveal that the presence of NO inhibits and promotes the oxidation of n-pentane at lower and higher temperatures, respectively, and has a significant effect on the oxidation initiation temperature and negative temperature coefficient (NTC) behavior of n-pentane. A new NO sensitized n-pentane mechanism, consists of a existing n-pentane base mechanism with an appropriate addition of our NOx sub-mechanism, is developed and refined to predict the experimental results. The key features of NO sensitized n-pentane oxidation are captured in the model and the kinetic effect of NO sensitization is detailed analyzed with varied temperatures.

AB - The low temperature oxidation of n-pentane with nitric oxide (NO) addition from 400K to 800K has been investigated in an atmospheric jet stirred reactor (JSR). The concentration of NO is varied from 0 to 1070ppm in the mixture to study its sensitization effect on the n-pentane oxidation. n-pentane, O2, CO, CO2, CH2O, CH2O, C2H4, CH3CHO, H2O2, NO, and NO2 are in-situ quantified by using the molecular beam mass spectrometer (MBMS), micro-gas chromatography (µ-GC), and the transportable dual-modulation faraday rotation spectrometer (DM-FRS) simultaneously. The experimental results reveal that the presence of NO inhibits and promotes the oxidation of n-pentane at lower and higher temperatures, respectively, and has a significant effect on the oxidation initiation temperature and negative temperature coefficient (NTC) behavior of n-pentane. A new NO sensitized n-pentane mechanism, consists of a existing n-pentane base mechanism with an appropriate addition of our NOx sub-mechanism, is developed and refined to predict the experimental results. The key features of NO sensitized n-pentane oxidation are captured in the model and the kinetic effect of NO sensitization is detailed analyzed with varied temperatures.

KW - Jet stirred reactor

KW - Low temperature chemistry

KW - NO sensitization

KW - n-pentane oxidation

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M3 - Paper

AN - SCOPUS:85049070562

T2 - 10th U.S. National Combustion Meeting

Y2 - 23 April 2017 through 26 April 2017

ER -

Kinetic study of low temperature oxidation of N-pentane with nitric oxide addition in a jet stirred reactor

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