Skip to main navigation
Skip to search
Skip to main content
Princeton University Home
Help & FAQ
Link opens in a new tab
Search content at Princeton University
Home
Profiles
Research units
Facilities
Projects
Research output
Press/Media
Ion beam implantation of surface layers
Daniel Recht
,
Yao Nan
Princeton Materials Institute
Research output
:
Chapter in Book/Report/Conference proceeding
›
Chapter
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Ion beam implantation of surface layers'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Beam System
25%
Concentration Profile
25%
Dopant Ions
25%
Doping Configuration
25%
Focused Ion Beam
50%
High-resolution Feature
25%
Impurities
25%
Ion Implantation
100%
Nonequilibrium Processes
25%
Proton Beam Therapy
100%
Quantum Computing
25%
Rapid Prototyping
25%
Single-photon Detector
25%
Subwavelength Optics
25%
Surface Layer
100%
Transistor
25%
Engineering
Beam System
25%
Concentration Profile
25%
Dopants
25%
Feature Size
25%
Focused Ion Beam
50%
High Resolution
25%
Ion Implantation
100%
Nonequilibrium
25%
Quantum Computer
25%
Rapid Prototyping
25%
Surface Layer
100%
Target Material
25%
Transistor
25%
Physics
Detectors
25%
High Resolution
25%
Ion Beam
100%
Ion Implantation
100%
Optics
25%
Quantum Computer
25%
Surface Layers
100%
Transistor
25%
Material Science
Doping (Additives)
25%
Focused Ion Beam
50%
Ion Implantation
100%
Rapid Prototyping
25%
Transistor
25%