TY - JOUR
T1 - Invited paper
T2 - 2009 Vehicles and Photons Symposium
AU - Sturm, James C.
AU - Hekmatshoar, Bahman
AU - Cherenack, Kuni
AU - Wagner, Sigurd
N1 - Funding Information:
This work was supported by the US Display Consortium. We also acknowledge the DuPont Company (R. Wessel and C. Simone)
Funding Information:
This work was supported by the US Display Consortium. We also acknowledge the DuPont Company (R. Wessel and C. Simone) for supplying the clear plastic substrates used in our work, and the collaboration of UDC (M. Hack and co-workers) for deposition of the phosphorescent OLED’s.
Publisher Copyright:
© 2009 SID.
PY - 2009
Y1 - 2009
N2 - We demonstrate critical elements of a-Si technology on clear plastic for flexible AMOLED applications. First, we show that a-Si TFT’s with gate voltages under 5 V provide sufficient current for OLED pixel brightness of over 1000 cd/m2, with minimum geometries (W/L = 1) for 100 µm × 100 µm pixels. Critical to this result is a clear plastic with the combined properties of high transparency, glass transition temperature in excess of 300oC, and low coefficient of thermal expansion. Second, we show that by engineering the a-Si TFT stack, under the bias conditions for pixel operation, the “half-life” of the TFT (defined as the time for the current to fall by 50% in DC operation) is 10 years for a 280oC process on clear plastic, and at least 100 years for 300oC. This is several orders of magnitude higher than that of common a-Si TFT processes and in general larger than the lifetimes for the 50% decay of the luminescence of the OLED’s themselves. Finally, we provide a framework demonstrating the tradeoff between drive current and TFT stability.
AB - We demonstrate critical elements of a-Si technology on clear plastic for flexible AMOLED applications. First, we show that a-Si TFT’s with gate voltages under 5 V provide sufficient current for OLED pixel brightness of over 1000 cd/m2, with minimum geometries (W/L = 1) for 100 µm × 100 µm pixels. Critical to this result is a clear plastic with the combined properties of high transparency, glass transition temperature in excess of 300oC, and low coefficient of thermal expansion. Second, we show that by engineering the a-Si TFT stack, under the bias conditions for pixel operation, the “half-life” of the TFT (defined as the time for the current to fall by 50% in DC operation) is 10 years for a 280oC process on clear plastic, and at least 100 years for 300oC. This is several orders of magnitude higher than that of common a-Si TFT processes and in general larger than the lifetimes for the 50% decay of the luminescence of the OLED’s themselves. Finally, we provide a framework demonstrating the tradeoff between drive current and TFT stability.
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U2 - 10.1889/1.3256963
DO - 10.1889/1.3256963
M3 - Conference article
AN - SCOPUS:84951281354
SN - 0097-966X
VL - 40
SP - 979
EP - 982
JO - Digest of Technical Papers - SID International Symposium
JF - Digest of Technical Papers - SID International Symposium
IS - 1
Y2 - 15 October 2009 through 16 October 2009
ER -