Abstract
We have noted the interference of O Kα ghost peaks in spectra obtained using unmonochromatized X-ray sources, particularly in C(KVV) and O(KVV) X-ray-excited Auger spectra. The source of the undesirable O Kα photons is a surface oxide on the Mg or Al anode of the polychromatic X-ray sources used. A calculation of the oxide thickness required to give the observed ghost intensity in measurements on a gold sample using a heavily oxidized Mg anode is given and the estimated oxide thickness found plausible. Since it may be impossible to operate the anode with no oxide present, the use of a standard Au sample is suggested as an excellent test for the presence of O Kα X-radiation from unmonochromatized X-ray sources.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 237-245 |
| Number of pages | 9 |
| Journal | Journal of Electron Spectroscopy and Related Phenomena |
| Volume | 22 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1981 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Radiation
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Spectroscopy
- Physical and Theoretical Chemistry