Interface Roughness Scattering Rate Equation Model of Long-wavelength Quantum Cascade Lasers

Ching Yu Chen, Yi Hsiu Chen, Claire F. Gmachl

Research output: Contribution to journalConference articlepeer-review

Abstract

The consideration of interface roughness scattering in the model of quantum cascade lasers enables the optimization of long-wavelength designs and predicts a twofold reduction in threshold current of our design compared to the current designs.

Original languageEnglish (US)
Article numberJTh2A.52
JournalOptics InfoBase Conference Papers
StatePublished - 2016
Externally publishedYes
EventCLEO: Applications and Technology, CLEO AT 2016 - San Jose, United States
Duration: Jun 5 2016Jun 10 2016

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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