Interface Roughness Scattering Rate Equation Model of Long-wavelength Quantum Cascade Lasers

Ching Yu Chen, Yi Hsiu Chen, Claire F. Gmachl

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The consideration of interface roughness scattering in the model of quantum cascade lasers enables the optimization of long-wavelength designs and predicts a twofold reduction in threshold current of our design compared to the current designs.

Original languageEnglish (US)
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO AT 2016
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781557528209
StatePublished - 2016
EventCLEO: Applications and Technology, CLEO AT 2016 - San Jose, United States
Duration: Jun 5 2016Jun 10 2016

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceCLEO: Applications and Technology, CLEO AT 2016
Country/TerritoryUnited States
CitySan Jose
Period6/5/166/10/16

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint

Dive into the research topics of 'Interface Roughness Scattering Rate Equation Model of Long-wavelength Quantum Cascade Lasers'. Together they form a unique fingerprint.

Cite this